• DocumentCode
    1103481
  • Title

    In-situ crystallization of YBaCuO films by the RF-diode sputtering method

  • Author

    Kajikawa, H. ; Fukumoto, Y. ; Hayashi, S. ; Shibutani, K. ; Ogawa, R. ; Kawate, Y.

  • Author_Institution
    Kobe Steel Ltd., Japan
  • Volume
    27
  • Issue
    2
  • fYear
    1991
  • fDate
    3/1/1991 12:00:00 AM
  • Firstpage
    1422
  • Lastpage
    1425
  • Abstract
    A recently developed temple-bell-type substrate holder in the conventional RF-diode sputtering method was used to obtain high-quality YBa2Cu3O7-y films. Avoiding the rush of negative ions into the films by placing the substrate perpendicular to the target surface led to the formation of highly oriented films with smooth surfaces on the various kinds of oxide substrates. The as-grown films deposited on SrTiO3 (100), SrTiO3 (110), and MgO (100) substrates showed a transition temperature of >80 K. The critical current densities were improved by post-oxygen annealing and reached values of more than 2×105 A/cm2 at 77 K in the films on the MgO (100) and SrTiO3 (100) substrates. However, AC susceptibility measurement showed that many weak links, presumably due to oxygen deficiencies, remained
  • Keywords
    barium compounds; critical current density (superconductivity); crystallisation; high-temperature superconductors; sputtered coatings; superconducting junction devices; superconducting thin films; superconducting transition temperature; yttrium compounds; 77 K; AC susceptibility measurement; MgO; RF-diode sputtering method; SrTiO3; YBaCuO; as-grown films; critical current densities; high temperature superconductors; in-situ crystallisation; post-O annealing; superconductors thin films; temple-bell-type substrate holder; transition temperature; weak links; Argon; Cathodes; Crystallization; Semiconductor films; Sputtering; Substrates; Superconducting films; Superconducting transition temperature; Surface morphology; Yttrium barium copper oxide;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.133451
  • Filename
    133451