DocumentCode :
1103507
Title :
The behaviour and properties of in-situ formed YBa2Cu 3Ox thin films during reversible oxidation/deoxidation
Author :
Morris, G.W. ; Tomlinson, E.J. ; Somekh, R.E. ; Barber, Z.H. ; Williams, E.J. ; Ray, M.P. ; Evetts, J.E.
Author_Institution :
Dept. of Mater. Sci. & Metall., Cambridge Univ., UK
Volume :
27
Issue :
2
fYear :
1991
fDate :
3/1/1991 12:00:00 AM
Firstpage :
1430
Lastpage :
1433
Abstract :
The authors have reversibly oxygenated and deoxygenated in situ-formed thin films of YBa2Cu3Ox by means of low-temperature anneals in oxygen and argon. The transition shape for slightly deoxygenated material is consistent with the existence of two superconducting phases, which may be distinguished by different oxygen ordering. The authors investigated Jc(B) as a function of oxygen content in samples whose oxygen content has been controlled by low-temperature anneals. The steep rise in Jc with Tc. has been demonstrated and the effect on Jc of change in c investigated. It is confirmed that in situ-formed films which have low Tc as-deposited have anomalously high c values, but it is demonstrated that good films (that is, films which as deposited have c~1.168 nm and Tc~90 K) follow the bulk c vs. Tc relationship when deoxygenated and reoxygenated in low-temperature anneals. The cause of the c expansion is attributed to a defect, possibly the substitution of Ba for Y, introduced at the time of film deposition under conditions of low mobility. Some data have been obtained which suggest that films deposited on substrates at higher temperatures have c vs. Tc more consistent with bulk data
Keywords :
barium compounds; critical current density (superconductivity); high-temperature superconductors; materials preparation; superconducting thin films; superconducting transition temperature; yttrium compounds; Jc; Tc; YBa2Cu3Ox; high temperature superconductor; low-temperature anneals; reversible oxidation/deoxidation; thin films; Annealing; Argon; Atmosphere; Lattices; Magnetic materials; Sputtering; Superconducting thin films; Temperature; Transistors; X-ray diffraction;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.133453
Filename :
133453
Link To Document :
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