Title :
VIA-2 Characterization of TEGFET´s and MESFET´s using the electrooptic sampling technique
Author :
Meyer, K.E. ; Dykaar, D.R. ; Mourou, G.A.
fDate :
11/1/1985 12:00:00 AM
Keywords :
Gallium arsenide; HEMTs; Laboratories; MESFETs; MOCVD; MODFETs; Optical pulses; Ring oscillators; Sampling methods; Substrates;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1985.22370
