DocumentCode

1103520

Title

VIA-2 Characterization of TEGFET´s and MESFET´s using the electrooptic sampling technique

Author

Meyer, K.E. ; Dykaar, D.R. ; Mourou, G.A.

Volume

32

Issue

11

fYear

1985

fDate

11/1/1985 12:00:00 AM

Firstpage

2551

Lastpage

2551

Keywords

Gallium arsenide; HEMTs; Laboratories; MESFETs; MOCVD; MODFETs; Optical pulses; Ring oscillators; Sampling methods; Substrates;

fLanguage

English

Journal_Title

Electron Devices, IEEE Transactions on

Publisher

ieee

ISSN

0018-9383

Type

jour

DOI

10.1109/T-ED.1985.22370

Filename

1485116