• DocumentCode
    1103589
  • Title

    High frequency performance of SiC heterojunction bipolar transistors

  • Author

    Gao, Guang-bo ; Sterner, Jeffery ; Morkoç, Hadis

  • Author_Institution
    Coordinated Sci. Lab., Illinois Univ., Urbana, IL, USA
  • Volume
    41
  • Issue
    7
  • fYear
    1994
  • fDate
    7/1/1994 12:00:00 AM
  • Firstpage
    1092
  • Lastpage
    1097
  • Abstract
    A compact heterojunction bipolar transistor (HBT) model was employed to simulate the high frequency and high power performances of SiC-based bipolar transistors. Potential 6H-SiC/3C-SiC heterojunction bipolar transistors (6H/3C-HBT´s) at case temperatures of 27°C (300 K) through 600°C (873 K) were investigated. The high frequency and high power performance was compared to AlGaAs/GaAs HBT´s. As expected, the ohmic contact resistance limits the high frequency performance of the SiC HBT. At the present time, it is only possible to reliably produce 1×10-4 Ω-cm2 contact resistances on SiC, so an fT of 4.4 GHz and an fmax of 3.2 GHz are the highest realistic values. However, assuming an incredibly low 1×10-6 Ω-cm2 contact resistance for the emitter, base, and collector terminals, an fT of 31.1 GHz and an fmax of 12.7 GHz can be obtained for a 6H/3C-SiC HBT
  • Keywords
    contact resistance; heterojunction bipolar transistors; ohmic contacts; power transistors; semiconductor device models; semiconductor materials; silicon compounds; solid-state microwave devices; 12.7 GHz; 27 C; 3.2 GHz; 31.1 GHz; 4.4 GHz; 600 C; HBT model; SiC; SiC heterojunction bipolar transistors; base; case temperatures; collector terminals; compact heterojunction bipolar transistor; emitter; high frequency performance; high power performances; ohmic contact resistance; Bipolar transistors; Contact resistance; Electron mobility; FETs; Frequency; Gallium arsenide; Heterojunction bipolar transistors; Photonic band gap; Silicon carbide; Temperature;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.293335
  • Filename
    293335