DocumentCode
1103609
Title
Theoretical study of the effect of an AlGaAs double heterostructure on metal-semiconductor-metal photodetector performance
Author
Salem, Ali F. ; Smith, Arlynn W. ; Brennan, Kevin F.
Author_Institution
Georgia Inst. of Technol., Atlanta, GA, USA
Volume
41
Issue
7
fYear
1994
fDate
7/1/1994 12:00:00 AM
Firstpage
1112
Lastpage
1119
Abstract
The impulse and square-wave input response of different GaAs metal-semiconductor-metal photodetector (MSM) designs are theoretically examined using a two dimensional drift-diffusion numerical calculation with a thermionic-field emission boundary condition model for the heterojunctions. The rise time and the fall time of the output signal current are calculated for a simple GaAs, epitaxially grown, MSM device as well as for various double-heterostructure barrier devices. The double heterostructure devices consist of an AlGaAs layer sandwiched between the top GaAs active absorption layer and the bottom GaAs substrate. The effect of the depth of the AlGaAs layer on the speed and responsivity of the MSM devices is examined. It is found that there is an optimal depth, at fixed applied bias, of the AlGaAs layer within the structure that provides maximum responsivity at minimal compromise in speed
Keywords
III-V semiconductors; aluminium compounds; gallium arsenide; metal-semiconductor-metal structures; photodetectors; semiconductor device models; transient response; 2D drift-diffusion numerical calculation; AlGaAs; AlGaAs double heterostructure; AlGaAs layer; GaAs; MSM device; MSM photodetectors; bottom GaAs substrate; double-heterostructure barrier devices; epitaxially grown; fall time; fixed applied bias; metal-semiconductor-metal photodetector performance; optimal depth; output signal current; responsivity; rise time; semiconductor heterojunctions; square-wave input response; thermionic-field emission boundary condition model; top GaAs active absorption layer; Absorption; Boundary conditions; Detectors; Fingers; Gallium arsenide; Heterojunctions; Photodetectors; Semiconductor process modeling; Substrates; Thermionic emission;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/16.293337
Filename
293337
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