DocumentCode :
1103630
Title :
Design and modeling of coupled pulse magnets (electrical and thermal)
Author :
Eyssa, Y.M. ; Wise, P. Pernambuco
Author_Institution :
Nat. High Magnetic Field Lab., Tallahassee, FL, USA
Volume :
32
Issue :
4
fYear :
1996
fDate :
7/1/1996 12:00:00 AM
Firstpage :
2522
Lastpage :
2525
Abstract :
Design and optimization of pulsed magnets requires development of computer codes that can analyze a multi-coil magnet system magnetically, thermally and mechanically. We present a FORTRAN computer code “Xheat” that can be used to design a multi-circuit pulsed magnet using one or more conductors and reinforcement materials. Xheat is circuit solver that can analyze nonlinear magnetically coupled LR and LRC circuits yielding currents, voltages and temperature distributions in the magnet winding as a function of time. The power source can be one or more of the following: (i) a capacitor bank, (ii) a current source, or (iii) a voltage source. A finite difference technique is used to calculate the properties after a small time step as a function of the temperature at that time. Eddy currents and magnetoresistance are included in resistance calculations. Xheat writes an input file to an elastic and plastic stress calculation codes that can generate stresses, strains and displacement in all magnet layers at the midplane
Keywords :
coupled circuits; electromagnets; finite difference methods; internal stresses; thermal analysis; Xheat FORTRAN computer code; circuit solver; coupled pulse magnets; design; eddy currents; elastic stress; electrical analysis; finite difference technique; magnetic analysis; magnetoresistance; mechanical analysis; modeling; multi-coil magnet system; nonlinear coupled circuits; optimization; plastic stress; resistance; thermal analysis; Conducting materials; Coupling circuits; Design optimization; Magnetic analysis; Magnetic circuits; Magnetic materials; Magnets; Stress; Temperature distribution; Voltage;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.511386
Filename :
511386
Link To Document :
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