DocumentCode :
1103882
Title :
An accelerated life test method for highly reliable on-board TWT´s with a coated impregnated cathode
Author :
Mita, Nagahisa
Author_Institution :
Satellite Commun. Syst. Lab., NTT Radio Commun. Syst. Labs., Kanagawa, Japan
Volume :
41
Issue :
7
fYear :
1994
fDate :
7/1/1994 12:00:00 AM
Firstpage :
1297
Lastpage :
1300
Abstract :
An accelerated life-test method is established for on-board TWT´s with an M-type cathode. This method is shown to be effective to predict the TWTs reliability. The M-type cathode has two life-limiting factors: impregnant reduction and surface coating degradation. The theoretical calculations of these factors under the accelerating conditions are confirmed by the life-test results. The highest acceleration is obtained at the cathode temperature of 1100 °CB with the cathode current density of 0.6 A/cm2. In this case the acceleration factor is derived to be 31. The lifetime distribution of TWT´s at the optimum cathode temperature is predicted using the derived acceleration factors. The Weibull distribution of BTTs (beam test tubes) fits a line with a slope of 3.2. From this result, TWT´s with an M-type cathodes at optimum cathode temperature show wear-out failure and their cumulative failure rate is under 0.5% during a useful life of 100 000 h
Keywords :
electron tube testing; life testing; oxide coated cathodes; reliability; travelling-wave-tubes; 100000 hour; 1100 C; M-type cathode; TWT reliability prediction; Weibull distribution; accelerated life test method; accelerating conditions; coated impregnated cathode; cumulative failure rate; highly reliable on-board TWT; impregnant reduction; life-limiting factors; surface coating degradation; wear-out failure; Acceleration; Cathodes; Coatings; Current density; Degradation; Kelvin; Life estimation; Life testing; Space exploration; Temperature;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.293361
Filename :
293361
Link To Document :
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