DocumentCode :
1104119
Title :
TTTC Newsletter
Author :
Kim, Bruce C.
Volume :
24
Issue :
4
fYear :
2007
Firstpage :
407
Lastpage :
407
Abstract :
This newsletter provides information on past and upcoming events related to the IEEE Computer Society´s Test Technology Technical Council and the test community.
Keywords :
ATS; DFT; EWDTS; ITC; TTTC; test technology;
fLanguage :
English
Journal_Title :
Design & Test of Computers, IEEE
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.2007.117
Filename :
4293193
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1104119
