DocumentCode
1104119
Title
TTTC Newsletter
Author
Kim, Bruce C.
Volume
24
Issue
4
fYear
2007
Firstpage
407
Lastpage
407
Abstract
This newsletter provides information on past and upcoming events related to the IEEE Computer Society´s Test Technology Technical Council and the test community.
Keywords
ATS; DFT; EWDTS; ITC; TTTC; test technology;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.2007.117
Filename
4293193
Link To Document