DocumentCode :
1104137
Title :
10 GHz surface impedance measurements of (Y,Er)BaCuO films produced by MOCVD, laser ablation, and sputtering
Author :
Luine, J. ; Daly, K. ; Hu, R. ; Kain, A. ; Lee, A. ; Manasevit, H. ; Pettiette-Hall, C. ; Simon, R. ; St.John, D. ; Wagner, M.
Author_Institution :
TRW Space & Technol. Group, Redondo Beach, CA, USA
Volume :
27
Issue :
2
fYear :
1991
fDate :
3/1/1991 12:00:00 AM
Firstpage :
1528
Lastpage :
1531
Abstract :
A parallel-plate resonator technique previously used to measure microwave surface resistance Rs(T) has been extended to measure absolute penetration depth λ(T). Measurements of both quantities near 10 GHz from 4.2 K to Tc are reported for ErBaCuO thin films produced by metalorganic chemical vapor deposition (MOCVD) and for YBaCuO thin films produced by laser ablation and single-target off-axis sputtering. Each production method gives rise to films whose surface resistance is below 1 mΩ at temperatures below 40 K. The low-temperature penetration depths range from 250 nm for the laser ablation and sputtered films to 800 nm for the MOCVD films. The penetration depths in all cases increase with temperature according to the Gorter-Casimir temperature dependence
Keywords :
CVD coatings; barium compounds; erbium compounds; high-temperature superconductors; penetration depth (superconductivity); superconducting thin films; surface conductivity; vapour deposited coatings; yttrium compounds; 10 GHz; 250 nm; 4.2 to 90 K; 800 nm; ErBaCuO; Gorter-Casimir temperature dependence; MOCVD; YBaCuO; absolute penetration depth; high temperature superconductor; laser ablation; microwave surface resistance; parallel-plate resonator technique; single-target off-axis sputtering; sputtering; thin films; Chemical lasers; Electrical resistance measurement; Impedance measurement; Laser ablation; MOCVD; Microwave measurements; Microwave theory and techniques; Sputtering; Surface resistance; Temperature dependence;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.133474
Filename :
133474
Link To Document :
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