• DocumentCode
    1104166
  • Title

    Analog-to-digital conversion and harmonic noises due to the integral nonlinearity

  • Author

    Kim, Kiseon

  • Author_Institution
    Superconducting Super Collider Lab., Dallas, TX, USA
  • Volume
    43
  • Issue
    2
  • fYear
    1994
  • fDate
    4/1/1994 12:00:00 AM
  • Firstpage
    151
  • Lastpage
    156
  • Abstract
    Analog-to-digital conversion inherently introduces unwanted harmonic noises due to the nonlinear transfer function error. It is essential to set proper models of the noise generation mechanisms, to quantify and compare the analytic performance of the high-resolution measurement systems including analog-to-digital converter (ADC). We addressed the importance of the integral nonlinearity in the analysis of the ADC system. We modeled the nonlinearity via a linear combination of simple power functions with single parameters and calculated the magnitudes of the harmonic noises generated by the sigmoidal shape of the ADC transfer function, analytically and numerically. For a typical ADC, a model x(1+ν)+μx2 was reasonably adopted, which produced the most significant harmonic noises at the second-and the third-order multiples of the fundamental frequency. Practical examples of the high-resolution ADC were observed, and demonstrated to show that the simple model explains the harmonic noises
  • Keywords
    Fourier transforms; analogue-digital conversion; harmonic analysis; signal processing; transfer functions; waveform analysis; ADC; analog-to-digital conversion; analog-to-digital converter; harmonic analysis; harmonic measurement; harmonic noise; high-resolution measurement; integral nonlinearity; models; noise generation; nonlinear transfer function error; power functions; second-order multiple; sigmoidal shape; third-order multiple; Analog-digital conversion; Multi-stage noise shaping; Noise generators; Noise measurement; Performance analysis; Power generation; Power system harmonics; Power system modeling; Shape; Transfer functions;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/19.293412
  • Filename
    293412