Title :
Bit-swapping LFSR for low-power BIST
Author :
Abu-Issa, A.S. ; Quigley, S.F.
Author_Institution :
Univ. of Birmingham, Birmingham
Abstract :
A modified linear feedback shift register (LFSR) is presented that reduces the number of transitions at the inputs of the circuit-under-test by 25% using a bit-swapping technique. Experimental results on ISCAS´85 and 89 benchmark circuits show up to 45% power reduction during test. They also show that the proposed design can be combined with other techniques to achieve a very substantial power reduction of up to 63%.
Keywords :
integrated circuit testing; low-power electronics; shift registers; bit-swapping; circuit-under-test; linear feedback shift register; low-power BIST; power reduction;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:20083481