• DocumentCode
    1104169
  • Title

    Bit-swapping LFSR for low-power BIST

  • Author

    Abu-Issa, A.S. ; Quigley, S.F.

  • Author_Institution
    Univ. of Birmingham, Birmingham
  • Volume
    44
  • Issue
    6
  • fYear
    2008
  • Firstpage
    401
  • Lastpage
    402
  • Abstract
    A modified linear feedback shift register (LFSR) is presented that reduces the number of transitions at the inputs of the circuit-under-test by 25% using a bit-swapping technique. Experimental results on ISCAS´85 and 89 benchmark circuits show up to 45% power reduction during test. They also show that the proposed design can be combined with other techniques to achieve a very substantial power reduction of up to 63%.
  • Keywords
    integrated circuit testing; low-power electronics; shift registers; bit-swapping; circuit-under-test; linear feedback shift register; low-power BIST; power reduction;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:20083481
  • Filename
    4472405
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1104169