DocumentCode
1104174
Title
Investigation of plasmon-induced losses in quasi-ballistic transport
Author
Lugli, P. ; Ferry, D.K.
Author_Institution
Arizona State University, Tempe, AZ
Volume
6
Issue
1
fYear
1985
fDate
1/1/1985 12:00:00 AM
Firstpage
25
Lastpage
27
Abstract
We present an ensemble Monte Carlo (EMC) simulation of the effect of electron-electron (e-e) and electron-plasmon (e-pl) interactions on the transient behavior of electrons under high energy injection conditions. It is shown that, in a situation that closely resembles that obtained in the base of a planar-doped barrier (PDB) transistor, the coulombic interaction severely limits the possibility of ballistic transport.
Keywords
Ballistic transport; Electromagnetic compatibility; Electrons; Helium; Monte Carlo methods; Optical scattering; Phonons; Plasma transport processes; Plasmons; Solid state circuits;
fLanguage
English
Journal_Title
Electron Device Letters, IEEE
Publisher
ieee
ISSN
0741-3106
Type
jour
DOI
10.1109/EDL.1985.26030
Filename
1485183
Link To Document