DocumentCode :
1104195
Title :
Measurement and simulation of crosstalk reduction by discrete discontinuities along coupled PCB traces
Author :
Novak, Istvan ; Eged, Bertalan ; Hatvani, Laszlo
Author_Institution :
Dept. of Microwave Telecommun., Tech. Univ. Budapest, Hungary
Volume :
43
Issue :
2
fYear :
1994
fDate :
4/1/1994 12:00:00 AM
Firstpage :
170
Lastpage :
175
Abstract :
Crosstalk among interconnects and printed-circuit board (PCB) traces is a major limiting factor of signal quality in high-speed digital and communication equipment. The paper evaluates coupled surface microstrip transmission lines with periodical loading and coupling. The situation may represent stray coupling and loading of digital buses due to connector pins, plated through holes at connector slots, and stubs as well as the input capacitance of active devices. This paper shows that discrete periodical coupling along coupled surface microstrip transmission lines may be used to reduce far-end crosstalk. An expression is given to calculate the discrete coupling capacitance to achieve optimum far-end crosstalk reduction. The reduction of far-end crosstalk is verified by measurements, and the good agreement between the simulated and measured data is shown. On the other hand, discrete loading does not significantly reduce near-end crosstalk, but will introduce additional ringing in the time domain
Keywords :
circuit analysis computing; crosstalk; electric noise measurement; frequency-domain analysis; interference suppression; lumped parameter networks; microstrip components; microstrip lines; printed circuit accessories; printed circuit testing; time-domain analysis; waveguide couplers; connector pins; coupled PCB traces; coupled surface microstrip transmission lines; crosstalk reduction; digital buses; digital communication equipment; discrete coupling capacitance; discrete discontinuities; discrete loading; discrete periodical coupling; far-end crosstalk reduction; high-speed communication equipment; measurement; near-end crosstalk; periodical loading; printed-circuit board; ringing; signal quality; simulation; stray coupling; time domain; Capacitance; Capacitors; Circuit testing; Coupling circuits; Crosstalk; Frequency; Impedance; Inductance; Microstrip; Transmission line measurements;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/19.293415
Filename :
293415
Link To Document :
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