DocumentCode
1104209
Title
Extended Bennia-Riad criterion for iterative frequency-domain deconvolution
Author
Dhaene, Tom ; Martens, Luc ; De Zutter, Daniel
Author_Institution
Dept. of Inf. Technol., Ghent Univ., Belgium
Volume
43
Issue
2
fYear
1994
fDate
4/1/1994 12:00:00 AM
Firstpage
176
Lastpage
180
Abstract
In this paper, we present a new, fast, robust and accurate iterative frequency-domain deconvolution technique. The deconvolution problem is mathematically classified as an ill-posed problem. We propose a new generalized deconvolution filter, and we use the so-called extended “Bennia-Riad” criterion to determine the optimal filter parameters
Keywords
filtering and prediction theory; frequency-domain analysis; iterative methods; microwave reflectometry; signal processing; time-domain reflectometry; transfer functions; extended Bennia-Riad criterion; generalized deconvolution filter; iterative frequency-domain deconvolution; microstrip line; microwave reflectometry; optimal filter parameters; Adaptive filters; Band pass filters; Cost function; Deconvolution; Frequency; Low pass filters; Measurement errors; Noise level; Noise reduction; Transfer functions;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/19.293416
Filename
293416
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