Title :
Extended Bennia-Riad criterion for iterative frequency-domain deconvolution
Author :
Dhaene, Tom ; Martens, Luc ; De Zutter, Daniel
Author_Institution :
Dept. of Inf. Technol., Ghent Univ., Belgium
fDate :
4/1/1994 12:00:00 AM
Abstract :
In this paper, we present a new, fast, robust and accurate iterative frequency-domain deconvolution technique. The deconvolution problem is mathematically classified as an ill-posed problem. We propose a new generalized deconvolution filter, and we use the so-called extended “Bennia-Riad” criterion to determine the optimal filter parameters
Keywords :
filtering and prediction theory; frequency-domain analysis; iterative methods; microwave reflectometry; signal processing; time-domain reflectometry; transfer functions; extended Bennia-Riad criterion; generalized deconvolution filter; iterative frequency-domain deconvolution; microstrip line; microwave reflectometry; optimal filter parameters; Adaptive filters; Band pass filters; Cost function; Deconvolution; Frequency; Low pass filters; Measurement errors; Noise level; Noise reduction; Transfer functions;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
