Effects of the Length of Thru on the Measurement Precision in TRL Technique

Author

Changying Wu ; Yuanchao Xu ; Jianying Li ; Gao, Smith

Author_Institution

Sch. of Electron. & Inf., Northwestern Polytech. Univ., Xi´an, China

Volume

24

Issue

12

fYear

2014

fDate

Dec. 2014

Firstpage

905

Lastpage

907

Abstract

The effect of the length of Thru on measurement precision in Thru-Reflect-Line (TRL) technique is investigated for the first time. Additional error matrices are introduced to represent random connection errors caused by soldering the adaptors and the test fixture. The simulated results show that the length of Thru periodically reduces the effects of connection errors on measurement results, and the length of Thru causing minimum error varies with the impedances of devices under test. The results are verified by experiments in which the copper tape is used to emulate and enlarge randomly distributed connection errors.

Keywords

error analysis; matrix algebra; measurement errors; network analysers; TRL technique; adaptors; copper tape; error matrices; measurement precision; random connection errors; soldering; test fixture; thru-reflect-line technique; Calibration; Capacitors; Copper; Length measurement; Microstrip; Transmission line matrix methods; Transmission line measurements; Calibration; error matrix; test fixture; thru-reflect-line (TRL) technique;

fLanguage

English

Journal_Title

Microwave and Wireless Components Letters, IEEE

Publisher

ieee

ISSN

1531-1309

Type

jour

DOI

10.1109/LMWC.2014.2361660

Filename

6924783