Title :
On U-Statistics and Compressed Sensing II: Non-Asymptotic Worst-Case Analysis
Author :
Lim, Felicia ; Stojanovic, Vladimir Marko
Author_Institution :
Res. Lab. of Electron., Massachusetts Inst. of Technol., Cambridge, MA, USA
Abstract :
In another related work, U-statistics were used for non-asymptotic average-case analysis of random compressed sensing matrices. In this companion paper the same analytical tool is adopted differently-here we perform non-asymptotic worst-case analysis. Simple union bounds are a natural choice for worst-case analyses, however their tightness is an issue (and questioned in previous works). Here we focus on a theoretical U-statistical result, which potentially allows us to prove that these union bounds are tight. To our knowledge, this kind of (powerful) result is completely new in the context of CS. This general result applies to a wide variety of parameters, and is related to (Stein-Chen) Poisson approximation. In this paper, we consider i) restricted isometries, and ii) mutual coherence. For the bounded case, we show that -th order restricted isometry constants have tight union bounds, when the measurements m = O (k(1.5(+ log(n/k))). Here, we require the restricted isometries to grow linearly in , however we conjecture that this result can be improved to allow them to be fixed. Also, we show that mutual coherence (with the standard estimate √(4 log n)/m) have very tight union bounds. For coherence, the normalization complicates general discussion, and we consider only Gaussian and Bernoulli cases here.
Keywords :
Gaussian processes; approximation theory; compressed sensing; matrix algebra; random processes; statistical analysis; Bernoulli case; CS; Gaussian case; Stein-Chen Poisson approximation; k-th order restricted isometry constant; non-asymptotic average-case analysis; nonasymptotic worst-case analysis; random compressed sensing matrix; theoretical U-statistical result; Approximation; compressed sensing; random matrices; statistics;
Journal_Title :
Signal Processing, IEEE Transactions on
DOI :
10.1109/TSP.2013.2255041