Title :
A high-precision RF vector analyzer based on synchronous sampling
Author :
Courteau, Raymond ; Bose, Tapan K.
Author_Institution :
Dielectric Res. Group, Quebec Univ., Trois-Rivieres, Que., Canada
fDate :
4/1/1994 12:00:00 AM
Abstract :
An RF/microwave amplitude and phase measurement system of exceptional linearity and stability (0.0001 dB) has been developed. In this system, the signals to be measured are transformed to discrete time digital signals by synchronous sampling and analog-to-digital conversion. These digital signals are then processed by a digital signal processor for vector detection and for computing digital feedback sent to the sampling gates. Digital iterative feedback is used to make the system insensitive to gain variations of the sampling gates. The method resembles that of dc substitution, but with vector capabilities, and is responsible for the high stability of the system. Furthermore, digital processing of the IF signals avoids the various IF imperfections of conventional vector analyzers such as gain range errors and detector circularity errors, which explains the exceptional linearity of the system. It is used as the basis for a high-performance dielectric measurement system working from 10 kHz to 500 MHz
Keywords :
analogue-digital conversion; dielectric measurement; frequency-domain analysis; iterative methods; microwave measurement; network analysers; signal processing equipment; 10 kHz to 500 MHz; IF signals; RF vector analyzer; RF/microwave amplitude measurement; analog-to-digital conversion; dc substitution; detector circularity errors; digital feedback; digital iterative feedback; digital signals; discrete time digital signals; exceptional linearity; gain range errors; high-performance dielectric measurement; linearity; phase measurement; sampling gates; stability; synchronous sampling; vector capabilities; vector detection; Analog-digital conversion; Feedback; Linearity; Phase measurement; Radio frequency; Sampling methods; Signal processing; Signal sampling; Stability; Time measurement;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on