• DocumentCode
    1104528
  • Title

    Holographic pattern measuring system and its application to deformation analysis of printed circuit board due to heat of mounted parts

  • Author

    Taniguchi, Masanari ; Takagi, Tasuku

  • Author_Institution
    Fac. of Sci. & Technol., Meijo Univ., Nagoya, Japan
  • Volume
    43
  • Issue
    2
  • fYear
    1994
  • fDate
    4/1/1994 12:00:00 AM
  • Firstpage
    326
  • Lastpage
    331
  • Abstract
    A new measuring system, holographic pattern measuring system (HPMS), was developed which is composed of both techniques of holographic interferometry and graphic image processing, and applied to deformation analysis of the printed circuit board (PCB) due to heat of mounted parts. The HPMS was applied to obtain the three-dimensional graphic image pattern of the deformation of-the PCB due to thermal stress with an error of 0.1 μm. In addition, the thermographic pattern was obtained by using a thermography system, and a comparison was made of the fringe pattern (holographic pattern) obtained by the HPMS and the thermographic pattern of the PCB surface due to thermal stress. We found that the holographic pattern was different from the thermographic pattern. The results showed that it was difficult to estimate the thermal deformation of the PCB from the thermographic pattern
  • Keywords
    calibration; deformation; displacement measurement; holographic interferometry; image processing equipment; printed circuit testing; printed circuits; stress measurement; thermal stresses; deformation; deformation analysis; fringe pattern; graphic image processing; heat of mounted parts; holographic interferometry; holographic pattern measurement; printed circuit board; thermal deformation; thermal stress; thermographic pattern; three-dimensional graphic image pattern; Circuit analysis; Displacement measurement; Electronic packaging thermal management; Graphics; Holography; Laser beams; Optical interferometry; Pattern analysis; Printed circuits; Thermal stresses;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/19.293443
  • Filename
    293443