Title :
Nonstatic effects in the GaAs permeable base transistor
Author :
Hwang, C.G. ; Navon, D.H. ; Tang, T.W.
Author_Institution :
University of Massachusetts, Amherst, MA
fDate :
3/1/1985 12:00:00 AM
Abstract :
Nonstatic transport effects in the permeable base transistor (PBT) are included in a two-dimensional multiparticle Monte Carlo (MC) analysis. This approach predicts charge depletion between the gate electrodes as VGSis increased over 0.5 V, as opposed to the accumulation of a net negative space charge predicted by the conventional static mobility model. More than a 60-percent increase in unity-current gain-frequency fT, of the PBT was predicted compared with the conventional result.
Keywords :
Charge carrier density; Doping; Electrodes; Electrons; Gallium arsenide; Monte Carlo methods; Predictive models; Programmable control;
Journal_Title :
Electron Device Letters, IEEE
DOI :
10.1109/EDL.1985.26064