DocumentCode
110456
Title
An Effective Thermal Model for FinFET Structure
Author
Ming-Cheng Cheng ; Smith, Jeffrey A. ; Wangkun Jia ; Coleman, Ron
Author_Institution
Clarkson Univ., Potsdam, NY, USA
Volume
61
Issue
1
fYear
2014
fDate
Jan. 2014
Firstpage
202
Lastpage
206
Abstract
This brief presents a physics-based thermal model for FinFET structure that is constructed mainly based on the concept of characteristic thermal lengths representing various heat loss paths for heat conduction along each segment of the fins, channel, and metal/poly wires. The model is calibrated by extracting the thermal resistances and thermal lengths describing the heat conduction and losses in each segment and extended to multifin structure to account for thermal coupling between fins. The accuracy of the model is demonstrated against 3-D numerical simulations.
Keywords
MOSFET; heat losses; thermal management (packaging); thermal resistance; wires (electric); 3D numerical simulations; FinFET structure; channel; heat conduction; heat loss paths; heat losses; metal/poly wires; multifin structure; physics-based thermal model; thermal coupling; thermal lengths; thermal resistances; FinFETs; Heating; Integrated circuit modeling; Logic gates; Metals; Thermal resistance; Wires; FinFET; thermal length; thermal model/circuit;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2013.2291512
Filename
6675039
Link To Document