• DocumentCode
    1104573
  • Title

    Radiation Characteristics of Electrically Small Devices in a TEM Transmission Cell

  • Author

    Tippet, John C. ; Chang, David C.

  • Author_Institution
    Electromagnetics Laboratory, Department of Electrical Engineering, University of Colorado, Boulder, CO 80309. (303) 492-8719 or 7539
  • Issue
    4
  • fYear
    1976
  • Firstpage
    134
  • Lastpage
    140
  • Abstract
    When making EMC measurements inside a shielded enclosure, the radiation characteristics of the device being tested changes. In this paper, the change in radiation resistance of dipole sources located inside a National Bureau of Standards TEM transmission cell is determined. In many cases a practical device can be modeled by dipole sources. In these cases the analysis allows one to predict the device´s radiation characteristics in other environments (e. g., free space).
  • Keywords
    Current measurement; Cutoff frequency; Electrical resistance measurement; Electromagnetic measurements; Electromagnetic radiation; Impedance; NIST; TEM cells; Testing; Transmission line theory;
  • fLanguage
    English
  • Journal_Title
    Electromagnetic Compatibility, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9375
  • Type

    jour

  • DOI
    10.1109/TEMC.1976.303492
  • Filename
    4090986
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1104573