Histogram measurement of ADC nonlinearities using sine waves

Author

Blair, Jerome

Author_Institution

EG&G Energy Meas. Inc., Las Vegas, NV, USA

Volume

43

Issue

3

fYear

1994

fDate

6/1/1994 12:00:00 AM

Firstpage

373

Lastpage

383

Abstract

This paper gives results concerning the measurement of differential and integral nonlinearity of ADC´s using the histogram method with a sine wave input signal. We specify the amount of overdrive required as a function of the noise level and the desired accuracy and the number of samples required as a function of the desired accuracy, the desired confidence level, and the noise level. An analysis of the effect on the results of harmonic distortion of the applied signal is given. The error analysis assumes a mixture of coherent and random sampling rather than pure random sampling

Keywords

analogue-digital conversion; digital simulation; electron device testing; error analysis; probability; random noise; signal processing; ADC nonlinearities; accuracy; coherent sampling; confidence level; differential nonlinearity; error analysis; harmonic distortion; histogram measurement; integral nonlinearity; noise; overdrive; random sampling; sine waves; Additive noise; Distortion measurement; Frequency; Harmonic distortion; Histograms; Noise level; Noise measurement; Sampling methods; Testing; Voltage;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.293454

Filename

293454