DocumentCode :
1104706
Title :
Dual five-port analyzer using fixed probes
Author :
Munoz, Juan ; Margineda, Jose ; Martin, Emesto ; Rojo, Marta
Author_Institution :
Dept. de Fisica, Murcia Univ., Spain
Volume :
43
Issue :
3
fYear :
1994
fDate :
6/1/1994 12:00:00 AM
Firstpage :
415
Lastpage :
420
Abstract :
A dual 5-port network analyzer using fixed electric probes is presented. To measure S11 and |S21|, the RF signal is applied to port 1 of the DUT through one 5-port junction. The same RF signal reflected by a short circuit at the end of the line is used for measuring S22. In this way, dividers, switches, and phase shifters as used in the standard dual technique are avoided. But S22 can only be measured for devices with |S21|>0.3. The 5-port junctions are inexpensive and very simple to design and operate. The mathematics involved uses simple linear algorithms, and iterative methods are not needed. Measurements for several loads have been performed in X-band, and the results agree with those obtained using an HP 8510B network analyzer
Keywords :
computerised instrumentation; microwave measurement; microwave reflectometry; network analysers; network analysis; probes; DUT; HP 8510B network analyzer; RF signal; S11; S21; S22; X-band; dual five-port analyzer; electric probes; fixed probes; iterative methods; linear algorithms; Calibration; Circuits; Current measurement; Electrooptical waveguides; Equations; Phase shifters; Probes; Reflection; Switches; Waveguide junctions;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/19.293460
Filename :
293460
Link To Document :
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