Title :
Electrical Conductivity Discontinuity at Melt in Phase Change Memory
Author :
Crespi, Luca ; Ghetti, Andrea ; Boniardi, Mattia ; Lacaita, Andrea L.
Author_Institution :
Dipt. di ElettronicaInformazione e Bioingegneria, Politec. di Milano, Milan, Italy
Abstract :
Discontinuity of electrical and thermal conductivity values at melt has been reported in phase change materials. Signatures of the effect are found in phase change memory cells with Wall architecture. A quantitative model describing the dependence on temperature of electrical and thermal conductivity values of the phase change alloy is introduced, covering the range from solid phase to beyond melt. The model has been implemented in a 3-D electro-thermal TCAD tool and successfully validated against the experimental results.
Keywords :
electrical conductivity; melt processing; phase change materials; phase change memories; thermal conductivity; 3D electro-thermal TCAD tool; electrical conductivity discontinuity; melt; phase change alloy; phase change materials; phase change memory; quantitative model; solid phase; temperature dependence; thermal conductivity; wall architecture; Conductivity; Phase change materials; Phase change memory; Temperature dependence; Temperature distribution; Temperature measurement; Thermal conductivity; Phase change memories; electrical conductivity; electrical conductivity.; non-volatile memories;
Journal_Title :
Electron Device Letters, IEEE
DOI :
10.1109/LED.2014.2320967