Title :
Data-processing methods for the determination of test quantities in high-power laboratories
Author :
van der Sluis, L. ; Cuilloux, G. ; Therme, Y. ; Costenaro, M.
Author_Institution :
KEMA High-Power Lab., Arnhem, Netherlands
fDate :
1/1/1990 12:00:00 AM
Abstract :
Results obtained by the Short-Circuit Testing Liaison (STL) task group dealing with the harmonization of methods used in high-power laboratories to compute tests results with data-acquisition systems are presented. The basic aim of the STL is the harmonized application of IEC standards to the type testing of high-voltage electrical equipment. An overview is presented of the methods used and their background
Keywords :
data acquisition; standards; testing; HV electrical equipment; IEC standards; STL; Short-Circuit Testing Liaison task group; data-acquisition systems; data-processing methods; Circuit testing; Data acquisition; Data processing; Electromagnetic transients; IEC standards; Instruments; Laboratories; Performance evaluation; Senior members; System testing;
Journal_Title :
Power Delivery, IEEE Transactions on
