• DocumentCode
    1105350
  • Title

    A microwave power double-heterojunction high electron mobility transistor

  • Author

    Hikosaka, K. ; Hirachi, Y. ; Mimura, T. ; Abe, M.

  • Author_Institution
    Fujitsu Laboratories Ltd., Atsugi, Japan
  • Volume
    6
  • Issue
    7
  • fYear
    1985
  • fDate
    7/1/1985 12:00:00 AM
  • Firstpage
    341
  • Lastpage
    343
  • Abstract
    A microwave power high electron mobility transistor (HEMT) has been developed and tested in the K -band frequency range. The HEMT has a unique configuration of a selectively low-doped (AlGa)As/GaAs/(AlGa)As double heterojunction resulting in both capability of high-current density and high gate breakdown voltage. The structure showed electron mobility of 6800 cm2/V.s and two-dimensional (2-D) electron density as high as 1.2 × 1012cm-2at room temperature. An output power of 660 mW (550 mW/mm) with 3.2-dB gain and 19.3-percent power added efficiency was achieved at 20 GHz with 1-µm gate length and 1.2-mm gate periphery. A similar device with 2.4-mm gate width produced an output power of 1 W with 3-dB gain and 15.5-percent efficiency. These results offer microwave high power capability in a double-heterojunction HEMT (DH-HEMT).
  • Keywords
    Electron mobility; Frequency; Gallium arsenide; HEMTs; Heterojunctions; MODFETs; Power generation; Temperature; Testing; Two dimensional displays;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/EDL.1985.26148
  • Filename
    1485301