DocumentCode :
1105350
Title :
A microwave power double-heterojunction high electron mobility transistor
Author :
Hikosaka, K. ; Hirachi, Y. ; Mimura, T. ; Abe, M.
Author_Institution :
Fujitsu Laboratories Ltd., Atsugi, Japan
Volume :
6
Issue :
7
fYear :
1985
fDate :
7/1/1985 12:00:00 AM
Firstpage :
341
Lastpage :
343
Abstract :
A microwave power high electron mobility transistor (HEMT) has been developed and tested in the K -band frequency range. The HEMT has a unique configuration of a selectively low-doped (AlGa)As/GaAs/(AlGa)As double heterojunction resulting in both capability of high-current density and high gate breakdown voltage. The structure showed electron mobility of 6800 cm2/V.s and two-dimensional (2-D) electron density as high as 1.2 × 1012cm-2at room temperature. An output power of 660 mW (550 mW/mm) with 3.2-dB gain and 19.3-percent power added efficiency was achieved at 20 GHz with 1-µm gate length and 1.2-mm gate periphery. A similar device with 2.4-mm gate width produced an output power of 1 W with 3-dB gain and 15.5-percent efficiency. These results offer microwave high power capability in a double-heterojunction HEMT (DH-HEMT).
Keywords :
Electron mobility; Frequency; Gallium arsenide; HEMTs; Heterojunctions; MODFETs; Power generation; Temperature; Testing; Two dimensional displays;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/EDL.1985.26148
Filename :
1485301
Link To Document :
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