Title :
An intercomparison of measurement techniques for the determination of the dielectric properties of solids at near millimetre wavelengths
Author :
Birch, James R. ; Simonis, George J. ; Afsar, M.N. ; Clarke, R.N. ; Dutta, J.M. ; Frost, H.M. ; Gerbaux, X. ; Hadni, A. ; Hall, William F. ; Heidinger, Roland ; Ho, William W. ; Jones, C.R. ; Königer, Franz ; Moore, Rick L. ; Matsuo, Hiroshi ; Nakano, T.
Author_Institution :
Nat. Phys. Lab., Teddington, UK
fDate :
6/1/1994 12:00:00 AM
Abstract :
The results of a measurement intercomparison aimed at assessing the systematic errors in near-millimetre-wavelength dielectric measurements on reasonably transparent solid specimens are presented and discussed. Various monochromatic, broad band, guided wave and free space measurement methods were intercompared in the frequency region from 30 to 900 GHz using round-robin measurements of the refractive index and absorption coefficient of seven specimens. Typically, systematic errors of up to 1% were found in the refractive index results, while very much larger systematic errors were found in the absorption results
Keywords :
dielectric measurement; measurement errors; microwave measurement; refractive index measurement; 30 to 900 GHz; EHF; THF; absorption coefficient; broad band method; dielectric properties; free space measurement method; guided wave method; measurement techniques; monochromatic method; near millimetre wavelengths; refractive index; round-robin measurements; solid dielectrics; systematic errors; Absorption; Dielectric measurements; Extraterrestrial measurements; Laboratories; Measurement techniques; Optical materials; Optical refraction; Optical variables control; Refractive index; Solids;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
