DocumentCode :
1105630
Title :
A three-dimensional photoresist image simulator: TRIPS-I
Author :
Matsuzawa, T. ; Ito, T. ; Tanuma, M. ; Hasegawa, N. ; Sunami, H.
Author_Institution :
Hitachi Ltd., Tokyo, Japan
Volume :
6
Issue :
8
fYear :
1985
fDate :
8/1/1985 12:00:00 AM
Firstpage :
416
Lastpage :
418
Abstract :
A simulator for a three-dimensional (3-D) photoresist image formation on flat substrates has been developed. Named Three-Dimensional Resist Imaging Process Simulator-I (TRIPS-I), the simulator consists of three subsimulators: one for the two-dimensional (2-D) distribution of projected light intensity, one for 3-D photosensitizer concentration distribution, and one for 3-D photoresist development. In regard to the first two, conventional procedures have been employed. The last, however, involves adoption of a ray tracing model based on the principle of least time.
Keywords :
Equations; Helium; Indium tin oxide; Laboratories; Optical imaging; Optical refraction; Optical surface waves; Ray tracing; Resists; Two dimensional displays;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/EDL.1985.26175
Filename :
1485328
Link To Document :
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