DocumentCode :
1105673
Title :
Temperature dependence of backgating effect in GaAs integrated circuits
Author :
Lee, C.P. ; Chang, M.F.
Author_Institution :
Rockwell International Corporation, Thousand Oaks, CA
Volume :
6
Issue :
8
fYear :
1985
fDate :
8/1/1985 12:00:00 AM
Firstpage :
428
Lastpage :
430
Abstract :
The backgating effect in GaAs IC´s has been found to be temperature dependent. The threshold voltage for backgating increases with temperature, resulting in lower backgating at higher temperatures. The measured activation energy of the backgating threshold versus temperature is 83 meV, in agreement with the energy difference between the Fermi level and the EL2 level at the surface of semi-insulating GaAs.
Keywords :
Circuits; Current measurement; Electrodes; Electron traps; FETs; Gallium arsenide; Leakage current; Temperature dependence; Temperature sensors; Threshold voltage;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/EDL.1985.26179
Filename :
1485332
Link To Document :
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