DocumentCode :
1105683
Title :
Direct measurement of the potential spike energy in AlGaAs/GaAs single-heterojunction bipolar transistors
Author :
Lin, H.H. ; Lee, S.C.
Author_Institution :
National Taiwan University, Taipei, Taiwan, Republic of China
Volume :
6
Issue :
8
fYear :
1985
fDate :
8/1/1985 12:00:00 AM
Firstpage :
431
Lastpage :
433
Abstract :
A balanced two-step current transport theory, i.e., thermionic emission followed by Shockley diffusion, is applied to study the emitter-base (EB) potential spike energy in the AlGaAs/GaAs single-heterojunction bipolar transistor. It is found, surprisingly, that when the transistor is operated in the active region the I-V characteristics of the collector current (IC) versus base-emitter applied voltage (VBE) exhibits an ideality factor of 1.237. This non-1kT transfer characteristics is due to the bias-dependent potential spike energy at the emitter-base heterojunction. The reverse I-V characteristics of emitter current (IE) versus base-collector bias (VBC), however, shows the traditional 1kT behavior. The difference between ICand IEat the same applied voltage ( V_{BE} = V_{BC} ) determines the potential spike energy (ΔE). It turns out that Δ E/q = 0.19 (V_{BE} - 0.48) where q is the unit charge. This indicates that the potential spike appears only when the applied voltage V_{BE} > 0.48 V.
Keywords :
Bipolar transistors; Electrons; Energy measurement; Gallium arsenide; Helium; Heterojunction bipolar transistors; Potential energy; Substrates; Thermionic emission; Voltage;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/EDL.1985.26180
Filename :
1485333
Link To Document :
بازگشت