DocumentCode
1105770
Title
Phase control by coating in 1.56 µm distributed feedback lasers
Author
Itaya, Yoshio ; Wakita, Koichi ; Motosugi, George ; Ikegami, Tetsuhiko
Author_Institution
NTT Electrical Communications Laboratories, Kanagawa, Japan
Volume
21
Issue
6
fYear
1985
fDate
6/1/1985 12:00:00 AM
Firstpage
527
Lastpage
533
Abstract
The dependence of performances on facet phase in distributed feedback lasers was studied by changing SiN film thickness on the cleaved facet. The phase relative to the corrugation could be determined with the measurement of oscillating wavelength shift in a device with and without antireflection coating on the facets. Using the facet phase measured, we could adjust the film thickness so as to reduce the threshold current and to stabilize single longitudinal mode operation which oscillated at the Bragg wavelength.
Keywords
Coatings; Distributed feedback (DFB) lasers; Gallium materials/lasers; Phase control; Silicon materials/devices; Coatings; Current measurement; Distributed feedback devices; Laser feedback; Phase control; Phase measurement; Silicon compounds; Thickness measurement; Threshold current; Wavelength measurement;
fLanguage
English
Journal_Title
Quantum Electronics, IEEE Journal of
Publisher
ieee
ISSN
0018-9197
Type
jour
DOI
10.1109/JQE.1985.1072719
Filename
1072719
Link To Document