DocumentCode :
1105861
Title :
Fabrication and analysis of record high 18.2% efficient solar cells on multicrystalline silicon material
Author :
Rohatgi, A. ; Narasimha, S. ; Kamra, S. ; Khattak, C.P.
Author_Institution :
Univ. Center of Excellence in Photovoltaic Res. & Educ., Georgia Inst. of Technol., Atlanta, GA, USA
Volume :
17
Issue :
8
fYear :
1996
Firstpage :
401
Lastpage :
403
Abstract :
Solar cell efficiencies of 18.2% (1 cm2 areas) have been achieved using a process sequence which involves impurity gettering on 0.65 /spl Omega/-cm multicrystalline silicon (mc-Si) grown by the heat exchanger method (HEM). This represents the highest reported solar cell efficiency on mc-Si to date. Photoconductive decay (PCD) measurements were used to monitor the lifetime in control samples which underwent the same process sequence as solar cells. PCD analysis reveals that HEM mc-Si material with an average as-grown bulk lifetime (/spl tau//sub b/) of 12 μs can achieve a lifetime as high as 135 μs by process-induced gettering. Internal quantum efficiency (IQE) measurements reveal that the effective diffusion length (L/sub eff/) in the finished devices is 244 μm (or close to 90% of the total device width). Detailed cell analysis shows that for this combination of /spl tau//sub b/ and L/sub eff/, the back surface recombination velocity (S/sub b/) of 10 000 cm/s or higher is the dominant efficiency limiting factor in the uniform regions of these mc-Si devices. Lowering S/sub b/ can raise the efficiency of untextured HEM mc-Si solar cells above 19.0%, thus closing the efficiency gap between good quality, untextured single crystal and mc-Si solar cells.
Keywords :
elemental semiconductors; getters; semiconductor technology; silicon; solar cells; 12 to 135 mus; 18.2 to 19 percent; Si; back surface recombination velocity; effective diffusion length; efficiency limiting factor; heat exchanger method; impurity gettering; internal quantum efficiency measurements; lifetime monitoring; multicrystalline Si material; photoconductive decay measurements; solar cell fabrication; untextured solar cells; Fabrication; Gettering; Impurities; Length measurement; Monitoring; Photoconducting materials; Photoconductivity; Photovoltaic cells; Silicon; Solar heating;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/55.511588
Filename :
511588
Link To Document :
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