High-resolution inversion of ultrasonic traces

Author

Zala, Cedric A.

Author_Institution

Barrodale Computing Services Ltd., Victoria, BC, Canada

Volume

39

Issue

4

fYear

1992

fDate

7/1/1992 12:00:00 AM

Firstpage

458

Lastpage

463

Abstract

An algorithm for estimating the acoustic reflection coefficient profile from ultrasonic traces obtained during inspection of layered materials is described. Given the measured trace and the incident wavelet, the inversion proceeds by means of a layer stripping approach combined with high-resolution deconvolution. The inversion algorithm is stable to noise and is suitable for use with bandlimited data. It is particularly suitable for use with materials that exhibit a few large discontinuities in impedance and in which multiple reflections in the data are evident. The performance of the algorithm is illustrated in tests with synthetic and real data. An implementation of the algorithm on a TMS 320C30 signal processing board allowed the inversion of an entire set of 256 traces, each of 256 elements, in 15 s.<>

Keywords

acoustic impedance; acoustic signal processing; inverse problems; ultrasonic materials testing; NDE; TMS 320C30 signal processing board; acoustic impedance; acoustic reflection coefficient profile; bandlimited data; high-resolution deconvolution; high-resolution inversion; inspection; inversion algorithm; layer stripping approach; layered materials; performance; ultrasonic traces; Acoustic materials; Acoustic measurements; Acoustic noise; Acoustic reflection; Deconvolution; Impedance; Inspection; Signal processing algorithms; Testing; Ultrasonic variables measurement;

fLanguage

English

Journal_Title

Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on

Publisher

ieee

ISSN

0885-3010

Type

jour

DOI

10.1109/58.148535

Filename

148535