Applications of the Near-Field Techniques in EMC Investigations

Author

Baudry, David ; Arcambal, Christian ; Louis, Anne ; Mazari, Bélahcéne ; Eudeline, Philippe

Author_Institution

Ecole Superieure d´´Ingenieurs Generalistes (ESIGELEC), Rouen

Volume

49

Issue

3

fYear

2007

Firstpage

485

Lastpage

493

Abstract

A completely automatic near-field mapping system has been developed within the Research Institute for Electronic Embedded Systems (IRSEEM) in order to determine the electromagnetic field created by electronic systems and components. This test bench uses a 3-D positioning system of the probe to make accurate measurements. This paper presents some applications of the near-field techniques in EMC investigations. In the first part, near-field measurements are used to locate precisely the electromagnetic sources of a limiter device. In the second part, we present an equivalent model of the radiated emission of an integrated circuit. In the last part, the near-field test bench is used to characterize faults in a cable.

Keywords

electromagnetic compatibility; electromagnetic fields; integrated circuits; 3D positioning system; EMC; Research Institute for Electronic Embedded Systems; automatic near-field mapping system; electromagnetic compatibility; electromagnetic field; electromagnetic sources; electronic systems; integrated circuit; radiated emission; Electromagnetic compatibility; Electromagnetic devices; Electromagnetic fields; Electromagnetic measurements; Embedded system; Integrated circuit measurements; Integrated circuit modeling; Position measurement; Probes; System testing; Component; electric field; electromgnetic compatibility (EMC); magnetic field; near-field measurement; probe;

fLanguage

English

Journal_Title

Electromagnetic Compatibility, IEEE Transactions on

Publisher

ieee

ISSN

0018-9375

Type

jour

DOI

10.1109/TEMC.2007.902194

Filename

4294117