DocumentCode :
1106295
Title :
A novel method of reducing the storage time of transistors
Author :
Narain, J.
Author_Institution :
Indian Institute of Technology, Kanpur, India
Volume :
6
Issue :
11
fYear :
1985
fDate :
11/1/1985 12:00:00 AM
Firstpage :
578
Lastpage :
579
Abstract :
During the transistor fabrication a recombination mechanism is incorporated within the base to reduce the storage time. In the emitter diffusion process, besides emitter, the same diffusion is also done in an annular region (within base) which surrounds the emitter. Connecting the base contact metal pattern to both the ohmic base contact and the annular diffused region provides a path for the majority and minority carriers to recombine. This additional recombination mechanism reduces the storage time of transistors.
Keywords :
Circuit testing; Clamps; Conductivity; Fabrication; Gold; Metallization; Radiative recombination; Schottky diodes; Semiconductor diodes; Silicon;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/EDL.1985.26236
Filename :
1485389
Link To Document :
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