• DocumentCode
    1106400
  • Title

    Theoretical and experimental analysis of a—Si:H logic circuits

  • Author

    Leroux, T. ; Truche, R. ; Chenevas-Paule, A.

  • Author_Institution
    LETI/IRDI, Grenoble Cedex, France
  • Volume
    6
  • Issue
    11
  • fYear
    1985
  • fDate
    11/1/1985 12:00:00 AM
  • Firstpage
    604
  • Lastpage
    605
  • Abstract
    Expressions of the static behavior of a-Si-H TFT´s previously established in our laboratory are used in order to calculate the theoretical transfer characteristics of enhanced/enhanced (E/E) inverters. These characteristics are shown to be strongly influenced by the parameters of the band-tail distribution of localized states (especially its critical temperature Tc), and consequently by the quality of the semiconductor thin film. Several experimental results are presented to confirm the obtained expressions.
  • Keywords
    Amorphous silicon; Driver circuits; Inverters; Laboratories; Liquid crystal displays; Logic circuits; Temperature dependence; Temperature distribution; Thin film transistors; Threshold voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/EDL.1985.26246
  • Filename
    1485399
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1106400