• DocumentCode
    1106630
  • Title

    Subthreshold and near-threshold conduction in GaAs/AlGaAs MODFETs

  • Author

    Jiang, Chun ; Tsui, D.C. ; Levy, H.M. ; Lee, Hao ; Kohn, Erhard

  • Author_Institution
    Dept. of Electr. Eng., Princeton Univ., NJ, USA
  • Volume
    36
  • Issue
    10
  • fYear
    1989
  • fDate
    10/1/1989 12:00:00 AM
  • Firstpage
    2281
  • Lastpage
    2287
  • Abstract
    The I-V characteristics of GaAs/AlGaAs MODFETs in the near-threshold and subthreshold regions were investigated. An examination of the long-gate-length (8-μm) devices shows that the source current (Is) in the subthreshold region has an exponential dependence on the gate voltage over four decades at 300 K with a gate swing S=63 mV/dec and over five decades at 77 K with S=17 mV/dec. A simple analytic model, with diffusion current in the subthreshold region and drift current in the near-threshold region, has been developed to described Is . The nonlinear charge control is based on a solution of Poisson´s equation with Fermi statistics, including depletion charges in the GaAs buffer layer. The conductance mobility in the whole density range has also been studied and compared with the Hall mobility. It is found that the mobility is constant in the subthreshold region and decreases with decreasing carrier density in the near-threshold region. The decrease is attributed to the carrier density fluctuation effect induced by the randomly distributed Si impurities in the AlGaAs layer
  • Keywords
    III-V semiconductors; aluminium compounds; carrier mobility; gallium arsenide; high electron mobility transistors; semiconductor device models; 300 K; 77 K; 8 micron; Fermi statistics; GaAs buffer layer; GaAs-AlGaAs; Hall mobility; I-V characteristics; Poisson´s equation; analytic model; carrier density fluctuation effect; conductance mobility; depletion charges; diffusion current; drift current; gate length; gate swing; gate voltage; near-threshold conduction; nonlinear charge control; randomly distributed Si impurities; source current; subthreshold regions; Buffer layers; Charge carrier density; Fluctuations; Gallium arsenide; HEMTs; Hall effect; MODFETs; Poisson equations; Statistics; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.40912
  • Filename
    40912