DocumentCode
1106630
Title
Subthreshold and near-threshold conduction in GaAs/AlGaAs MODFETs
Author
Jiang, Chun ; Tsui, D.C. ; Levy, H.M. ; Lee, Hao ; Kohn, Erhard
Author_Institution
Dept. of Electr. Eng., Princeton Univ., NJ, USA
Volume
36
Issue
10
fYear
1989
fDate
10/1/1989 12:00:00 AM
Firstpage
2281
Lastpage
2287
Abstract
The I -V characteristics of GaAs/AlGaAs MODFETs in the near-threshold and subthreshold regions were investigated. An examination of the long-gate-length (8-μm) devices shows that the source current (I s) in the subthreshold region has an exponential dependence on the gate voltage over four decades at 300 K with a gate swing S =63 mV/dec and over five decades at 77 K with S =17 mV/dec. A simple analytic model, with diffusion current in the subthreshold region and drift current in the near-threshold region, has been developed to described I s . The nonlinear charge control is based on a solution of Poisson´s equation with Fermi statistics, including depletion charges in the GaAs buffer layer. The conductance mobility in the whole density range has also been studied and compared with the Hall mobility. It is found that the mobility is constant in the subthreshold region and decreases with decreasing carrier density in the near-threshold region. The decrease is attributed to the carrier density fluctuation effect induced by the randomly distributed Si impurities in the AlGaAs layer
Keywords
III-V semiconductors; aluminium compounds; carrier mobility; gallium arsenide; high electron mobility transistors; semiconductor device models; 300 K; 77 K; 8 micron; Fermi statistics; GaAs buffer layer; GaAs-AlGaAs; Hall mobility; I-V characteristics; Poisson´s equation; analytic model; carrier density fluctuation effect; conductance mobility; depletion charges; diffusion current; drift current; gate length; gate swing; gate voltage; near-threshold conduction; nonlinear charge control; randomly distributed Si impurities; source current; subthreshold regions; Buffer layers; Charge carrier density; Fluctuations; Gallium arsenide; HEMTs; Hall effect; MODFETs; Poisson equations; Statistics; Voltage;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/16.40912
Filename
40912
Link To Document