DocumentCode :
110676
Title :
A Fully Integrated 60-GHz CMOS Transceiver Chipset Based on WiGig/IEEE 802.11ad With Built-In Self Calibration for Mobile Usage
Author :
Saito, Nobuo ; Tsukizawa, T. ; Shirakata, N. ; Morita, Takahito ; Tanaka, Kiyoshi ; Sato, Jun ; Morishita, Yu ; Kanemaru, M. ; Kitamura, R. ; Shima, Tal ; Nakatani, Takeshi ; Miyanaga, K. ; Urushihara, T. ; Yoshikawa, Hideki ; Sakamoto, Takanori ; Motozuk
Author_Institution :
R&D Div. Device Solution Center, Panasonic Corp., Yokohama, Japan
Volume :
48
Issue :
12
fYear :
2013
fDate :
Dec. 2013
Firstpage :
3146
Lastpage :
3159
Abstract :
This paper presents a fully integrated transceiver chipset based on the WiGig/IEEE 802.11ad standard targeting mobile usage. The chipset is developed for single-carrier (SC) modulation, which is suitable for reduced power consumption. However, the SC modulation is sensitive to in-band amplitude variations, mainly made worse by the gain variations of analog circuits and multipath delay spread. In order to compensate for these gain variations, the proposed chipset employs built-in TX in-band calibration and an RX frequency domain equalizer (FDE). The proposed techniques relax the requirement for high speed analog circuits, leading to less power consumption while minimizing the increase of hardware size. The test chip achieves 1.8 Gb/s MAC throughput for up to 40 cm and 1.5 Gb/s for up to 1 m while consuming 788 mW in TX and 984 mW in RX mode.
Keywords :
CMOS integrated circuits; analogue circuits; radio transceivers; CMOS transceiver chipset; RX frequency domain equalizer; SC modulation; WiGig/IEEE 802.11ad; analog circuits; built-in self calibration; frequency 60 GHz; gain variations; mobile usage; multipath delay spread; power 788 mW; power 984 mW; power consumption; single carrier modulation; Calibration; Cutoff frequency; Gain; Modulation; Radiofrequency integrated circuits; Standards; Transceivers; 60 GHz; Built-in Self Calibration (BiSC); CMOS; IEEE 802.11ad; WiGig; direct conversion; frequency domain equalizer (FDE); transceiver;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2013.2279573
Filename :
6589015
Link To Document :
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