Title :
Image distortion analysis using polynomial series expansion
Author :
Baggenstoss, Paul M.
Author_Institution :
Naval Undersea Warfare Center, Newport, RI, USA
Abstract :
In this paper, we derive a technique for analysis of local distortions which affect data in real-world applications. In the paper, we focus on image data, specifically handwritten characters. Given a reference image and a distorted copy of it, the method is able to efficiently determine the rotations, translations, scaling, and any other distortions that have been applied. Because the method is robust, it is also able to estimate distortions for two unrelated images, thus determining the distortions that would be required to cause the two images to resemble each other. The approach is based on a polynomial series expansion using matrix powers of linear transformation matrices. The technique has applications in pattern recognition in the presence of distortions.
Keywords :
computer vision; handwritten character recognition; image registration; matrix algebra; polynomial approximation; text analysis; computer vision; handwritten characters; image distortion analysis; image registration; linear transformation matrices; pattern recognition; polynomial series expansion; text processing; Additive noise; Application software; Computer vision; Image analysis; Image registration; Noise robustness; Pattern recognition; Polynomials; Testing; Text processing; Index Terms- Image processing and computer vision; computer vision; image registration; pattern recognition; text processing; text processing.; Algorithms; Artificial Intelligence; Automatic Data Processing; Cluster Analysis; Computer Graphics; Computer Simulation; Handwriting; Image Enhancement; Image Interpretation, Computer-Assisted; Information Storage and Retrieval; Numerical Analysis, Computer-Assisted; Pattern Recognition, Automated; Reading; Reproducibility of Results; Sensitivity and Specificity; Signal Processing, Computer-Assisted; Subtraction Technique; User-Computer Interface;
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
DOI :
10.1109/TPAMI.2004.106