• DocumentCode
    1106818
  • Title

    Effective multiresolution arc segmentation: algorithms and performance evaluation

  • Author

    Song, Jiqiang ; Lyu, Michael R. ; Cai, Shijie

  • Author_Institution
    Dept. of Comput. Sci. & Eng., Chinese Univ. of Hong Kong, China
  • Volume
    26
  • Issue
    11
  • fYear
    2004
  • Firstpage
    1491
  • Lastpage
    1506
  • Abstract
    Arc segmentation plays an important role in the process of graphics recognition from scanned images. The GREC arc segmentation contest shows that there is a lot of room for improvement in this area. This paper proposes a multiresolution arc segmentation method based on our previous seeded circular tracking algorithm which largely depends on the OOPSV model. The newly-introduced multiresolution paradigm can handle arcs/circles with large radii well. We describe new approaches for arc seed detection, arc localization, and arc verification, making the proposed method self-contained and more efficient. Moreover, this paper also brings major improvement to the dynamic adjustment algorithm of circular tracking to make it more robust. A systematic performance evaluation of the proposed method has been conducted using the third-party evaluation tool and test images obtained from the GREC arc segmentation contests. The overall performance over various arc angles, arc lengths, line thickness, noises, arc-arc intersections, and arc-line intersections has been measured. The experimental results and time complexity analyses on real scanned images are also reported and compared with other approaches. The evaluation result demonstrates the stable performance and the significant improvement on processing large arcs/circles of the MAS method.
  • Keywords
    computational complexity; image recognition; image resolution; image segmentation; tracking; GREC arc segmentation; OOPSV model; arc angles; arc lengths; arc localization; arc seed detection; arc verification; arc-arc intersections; arc-line intersections; circular tracking algorithm; dynamic adjustment algorithm; graphics recognition; line thickness; multiresolution arc segmentation; performance evaluation; real scanned images; test images; third party evaluation tool; time complexity analyses; Graphics; Heuristic algorithms; Image analysis; Image recognition; Image segmentation; Length measurement; Noise measurement; Noise robustness; System testing; Thickness measurement; Index Terms- Graphics recognition; arc segmentation; circular tracking; multiresolution; performance evaluation.; vectorization; Algorithms; Artificial Intelligence; Cluster Analysis; Computer Graphics; Computer Simulation; Image Enhancement; Image Interpretation, Computer-Assisted; Information Storage and Retrieval; Numerical Analysis, Computer-Assisted; Pattern Recognition, Automated; Reproducibility of Results; Sensitivity and Specificity; Signal Processing, Computer-Assisted; Subtraction Technique; User-Computer Interface;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/TPAMI.2004.103
  • Filename
    1335453