Proposed chapter 9 for predicting voltage sags (dips) in revision to IEEE Std 493, the Gold Book

Author

Becker, Carl ; Braun, William, Jr. ; Carrick, Kenneth ; Diliberti, Tom ; Grigg, Cliff ; Groesch, Joe ; Hazen, Bill ; Imel, Tom ; Koval, Don ; MUELLER, David ; St.John, T. ; Conrad, Larry E.

Author_Institution

Dept. of Ind. & Commercial Power Syst., Power Systems Reliability Subcommittee, Plainfield, IN, USA

Volume

30

Issue

3

fYear

1994

Firstpage

805

Lastpage

821

Abstract

Voltage sags, also known as dips, are important to industrial power system reliability. Modern process controls are often sensitive to voltage sags. The combination of voltage sags and sensitive equipment may cause significant production outages. Less sensitive equipment may be available, but the designer must know sag characteristics of the electric system to make the best choices between reliability and equipment cost. This paper shows how to predict voltage sag performance of electric supply systems by combining a new analysis method with reliability data. The analysis method is proposed for a new chapter in the next revision of IEEE Std 493

Keywords

power supply quality; power system reliability; standards; IEEE Std 493; equipment cost; industrial power system reliability; outages; performance prediction; power supply quality; process controls; voltage dips; voltage sags; Books; Circuit analysis computing; Circuit faults; Electronics packaging; Gold; Industrial power systems; Power quality; Production; Senior members; Voltage fluctuations;

fLanguage

English

Journal_Title

Industry Applications, IEEE Transactions on

Publisher

ieee

ISSN

0093-9994

Type

jour

DOI

10.1109/28.293731

Filename

293731