Title :
Proposed chapter 9 for predicting voltage sags (dips) in revision to IEEE Std 493, the Gold Book
Author :
Becker, Carl ; Braun, William, Jr. ; Carrick, Kenneth ; Diliberti, Tom ; Grigg, Cliff ; Groesch, Joe ; Hazen, Bill ; Imel, Tom ; Koval, Don ; MUELLER, David ; St.John, T. ; Conrad, Larry E.
Author_Institution :
Dept. of Ind. & Commercial Power Syst., Power Systems Reliability Subcommittee, Plainfield, IN, USA
Abstract :
Voltage sags, also known as dips, are important to industrial power system reliability. Modern process controls are often sensitive to voltage sags. The combination of voltage sags and sensitive equipment may cause significant production outages. Less sensitive equipment may be available, but the designer must know sag characteristics of the electric system to make the best choices between reliability and equipment cost. This paper shows how to predict voltage sag performance of electric supply systems by combining a new analysis method with reliability data. The analysis method is proposed for a new chapter in the next revision of IEEE Std 493
Keywords :
power supply quality; power system reliability; standards; IEEE Std 493; equipment cost; industrial power system reliability; outages; performance prediction; power supply quality; process controls; voltage dips; voltage sags; Books; Circuit analysis computing; Circuit faults; Electronics packaging; Gold; Industrial power systems; Power quality; Production; Senior members; Voltage fluctuations;
Journal_Title :
Industry Applications, IEEE Transactions on
