DocumentCode
1106861
Title
Effective Wire Models for X-Architecture Placement
Author
Chen, Tung-Chieh ; Chuang, Yi-Lin ; Chang, Yao-Wen
Author_Institution
Nat. Taiwan Univ., Taipei
Volume
27
Issue
4
fYear
2008
fDate
4/1/2008 12:00:00 AM
Firstpage
654
Lastpage
658
Abstract
In this paper, we derive the X-half-perimeter wirelength (XHPWL) model for X-architecture placement and explore the effects of three different wire models on X-architecture placement, including the Manhattan-half-perimeter wirelength (MHPWL) model, the XHPWL model, and the X-Steiner wirelength (XStWL) model. For min-cut partitioning placement, we apply the XHPWL and XStWL models to the generalized net-weighting method that can exactly model the wirelength after partitioning by net weighting. For analytical placement, we smooth the XHPWL function using log-sum-exp functions to facilitate analytical placement. This paper shows that both the XHPWL and XStWL models can reduce the X wirelength effectively. In particular, our results reveal the effectiveness of the X architecture on wirelength reduction during placement and, thus, the importance of the study on the X-placement algorithms, which is different from the results given in the work of Ono et al. which suggests that the X-architecture placement might not improve the X-routing wirelength over the Manhattan-architecture placement.
Keywords
integrated circuit design; Manhattan-architecture placement; Manhattan-half-perimeter wirelength model; X-Steiner wirelength model; X-architecture placement; X-half-perimeter wirelength; log-sum-exp functions; min-cut partitioning placement; net weighting partitioning; wire models; Circuit optimization; Costs; Delay; Geometry; Integrated circuit interconnections; Partitioning algorithms; Pins; Routing; Wire; Wiring; Min-cut; Steiner tree; X architecture; net weighting; partitioning; physical design; placement;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/TCAD.2008.917959
Filename
4475243
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