Title :
On the Design of Minimum Length Fault Tests for Combinational Circuits
Author :
Bearnson, L.W. ; Carroll, Chester C.
Author_Institution :
IEEE
Abstract :
Techniques for deriving the minimum length tests are developed for irredundant combinational circuits that contain single faults. The development is based on the Boolean difference function. The Boolean difference function is expanded to form two analytical expressions that can be used to calculate the tests for any stuck-at-zero and stuck-at-one fault within combinational circuits.
Keywords :
Error correction, fault detection, fault diagnosis.; Circuit faults; Circuit testing; Combinational circuits; Electrical fault detection; Equations; Fault detection; Fault diagnosis; Logic circuits; Logic testing; Missiles; Error correction, fault detection, fault diagnosis.;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/T-C.1971.223137
