• DocumentCode
    1106960
  • Title

    Systematic study of fields due to extended apertures by Gaussian beam discretization

  • Author

    Maciel, John J. ; Felsen, Leopold B.

  • Author_Institution
    Raytheon Co., Tewksbury, MA, USA
  • Volume
    37
  • Issue
    7
  • fYear
    1989
  • fDate
    7/1/1989 12:00:00 AM
  • Firstpage
    884
  • Lastpage
    892
  • Abstract
    Gaussian beams are used as basis elements in field representations. To gain insight into how the choice of beam parameters affects the final representation, a systematic study for the simple test case of a one-dimensional linearly phased cosine-aperture distribution has been undertaken. By successively adding individual displaced and/or tilted beams with large, narrow, or matched waists, one can assess how the elements in various portions of the lattice contribute to the build-up of the actual field in the aperture, near zone, and far zone. Adding enough beams always guarantees homing in on the exact solution, as is verified here by independent comparison. Different beam choices imply different modeling of the radiation process. The understanding gained thereby is helpful for selecting beam parameters in subsequent applications where it is necessary to balance requirements of good convergence, ease of computation, and ability to track the beams through perturbing environments like a radome. Indications are that the narrow beams provide the most robust and versatile formulation to deal with these generalized conditions
  • Keywords
    electromagnetic field theory; electromagnetic wave propagation; EM fields; EM propagation; Gaussian beam discretization; beam parameters; extended apertures; far zone; field representations; near zone; one-dimensional linearly phased cosine-aperture distribution; systematic study; Acoustic propagation; Analytical models; Apertures; Costs; Electromagnetic propagation; Lattices; Machinery; Robustness; Stacking; System testing;
  • fLanguage
    English
  • Journal_Title
    Antennas and Propagation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-926X
  • Type

    jour

  • DOI
    10.1109/8.29383
  • Filename
    29383