DocumentCode
1107001
Title
Quasi-Peak-to-RMS Voltage Conversion
Author
Cook, James H.
Author_Institution
The IIT Research Institute Staff at The Department of Defense Electromagnetic Compatibility Analysis Center, Annapolis, MD 21402 (301) 267-2350
Issue
1
fYear
1979
Firstpage
9
Lastpage
12
Abstract
A technique is presented by which the conversion between quasi-peak and rms voltage levels may be made for any noise process for which the relative amplitude probability distribution is known. The technique is not exact, since it requires that the time waveform of the quasi-peak voltage be constant. However, the resulting error seems to be smail for many cases. Several results obtained using the techniques are given and compared with measurements. An analysis is also presented of the effect of the constant quasi-peak voltage requirement on the error.
Keywords
Capacitors; Circuit noise; Degradation; Detectors; Equations; Integrated circuit noise; Noise level; Noise measurement; Quadratic programming; Voltage; APD; Quasi-peak; rms;
fLanguage
English
Journal_Title
Electromagnetic Compatibility, IEEE Transactions on
Publisher
ieee
ISSN
0018-9375
Type
jour
DOI
10.1109/TEMC.1979.303790
Filename
4091237
Link To Document