• DocumentCode
    1107001
  • Title

    Quasi-Peak-to-RMS Voltage Conversion

  • Author

    Cook, James H.

  • Author_Institution
    The IIT Research Institute Staff at The Department of Defense Electromagnetic Compatibility Analysis Center, Annapolis, MD 21402 (301) 267-2350
  • Issue
    1
  • fYear
    1979
  • Firstpage
    9
  • Lastpage
    12
  • Abstract
    A technique is presented by which the conversion between quasi-peak and rms voltage levels may be made for any noise process for which the relative amplitude probability distribution is known. The technique is not exact, since it requires that the time waveform of the quasi-peak voltage be constant. However, the resulting error seems to be smail for many cases. Several results obtained using the techniques are given and compared with measurements. An analysis is also presented of the effect of the constant quasi-peak voltage requirement on the error.
  • Keywords
    Capacitors; Circuit noise; Degradation; Detectors; Equations; Integrated circuit noise; Noise level; Noise measurement; Quadratic programming; Voltage; APD; Quasi-peak; rms;
  • fLanguage
    English
  • Journal_Title
    Electromagnetic Compatibility, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9375
  • Type

    jour

  • DOI
    10.1109/TEMC.1979.303790
  • Filename
    4091237