DocumentCode :
110719
Title :
Investigation of Delamination Mechanisms in IBAD-MOCVD REBCO Coated Conductors
Author :
Majkic, Goran ; Galstyan, Eduard ; Yifei Zhang ; Selvamanickam, Venkat
Author_Institution :
Dept. of Mech. Eng., Univ. of Houston, Houston, TX, USA
Volume :
23
Issue :
3
fYear :
2013
fDate :
Jun-13
Firstpage :
6600205
Lastpage :
6600205
Abstract :
In recent years, remarkable technical advances have been achieved in the development of Rare-earth-Ba-Cu-O (REBCO) based coated conductors for large-scale applications. For coil-based applications (e.g., motors, generators, magnets), in addition to high critical current density under applied field, the conductor also needs to maintain mechanical integrity when exposed to transverse tensile stresses typically found in impregnated coils. In this study, we present a detailed analysis of the microstructure of REBCO coated conductors delaminated by application of transverse tensile stresses, in an effort to gain insight into the underlying mechanisms of failure and the weak link in the multilayer conductor architecture. In addition, we perform statistical analysis of delaminated areas of multilayer coated conductors subjected to c-axis pull experiments. Results on optical image correlation of fractured surfaces, analysis of buffer layer defects, and analysis of variance of data scatter are presented.
Keywords :
MOCVD; barium compounds; conductors (electric); delamination; high-temperature superconductors; ion beam assisted deposition; multilayers; rare earth compounds; statistical analysis; IBAD-MOCVD REBCO coated conductor; REBCO coated conductor microstructure; buffer layer defect; delamination mechanism; failure; fractured surface; multilayer coated conductor; multilayer conductor architecture; optical image correlation; rare-earth-Ba-Cu-O based coated conductors; statistical analysis; transverse tensile stress; variance of data scatter; Coils; Conductors; Delamination; High temperature superconductors; Surface cracks; Tensile stress; Coated conductor; REBCO; delamination mechanism; microstructure;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/TASC.2012.2237496
Filename :
6400225
Link To Document :
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