Title :
Compact Spreading Resistance Model for Rectangular Contacts on Uniform and Epitaxial Substrates
Author :
Kristiansson, Simon ; Ingvarson, Fredrik ; Jeppson, Kjell O.
Author_Institution :
Chalmers Univ. of Technol., Goteborg
Abstract :
We present a compact analytical spreading resistance model for substrate noise coupling analysis. The model can handle rectangular contacts on uniform substrates of finite thickness with a grounded backplane. In contrast to previously published compact models, the model does not require extraction of fitting parameters. The model is also scalable with the resistivity and thickness of the substrate, and with the contact size. The model is verified with extensive finite-element calculations, and the accuracy is shown to be good. We also show that the model can predict the spreading resistance on epitaxial substrates.
Keywords :
contact resistance; finite element analysis; integrated circuit interconnections; integrated circuit modelling; integrated circuit noise; monolithic integrated circuits; semiconductor epitaxial layers; substrates; compact spreading resistance model; epitaxial substrates; finite-element calculations; grounded backplane; rectangular contacts; substrate noise coupling analysis; uniform substrates; Backplanes; Boundary value problems; Circuit noise; Conductivity; Contact resistance; Coupling circuits; Integral equations; Semiconductor process modeling; Substrates; Surface resistance; Elliptic integral; rectangular contact; spreading resistance modeling; substrate noise coupling;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/TED.2007.902689