Subtractive effect of charge integration on dual-gate CID readout with correlated double sampling

In this paper we describe the physical mechanisms of the "subtractive effect" on the dual-gate charge-injection device (CID) readout due to on-going charge integration during the time the video waveform is processed with correlated double sampling. Performance degradation of the CID area array caused by the subtractive effect and two correction schemes for eliminating the problems under different irradiation conditions are discussed.