DocumentCode :
1107456
Title :
Subpicosecond electrooptic sampling: Principles and applications
Author :
Valdmanis, Janis A. ; Mourou, G.
Author_Institution :
AT&T Bell Lab., Murray Hill, NJ, USA
Volume :
22
Issue :
1
fYear :
1986
fDate :
1/1/1986 12:00:00 AM
Firstpage :
69
Lastpage :
78
Abstract :
This paper reviews the principles and applications of electrooptic sampling for the characterization of repetitive ultrafast electrical transients. Electrooptic sampling is an electric field sensitive technique that utilizes ultrashort optical pulses as "sampling gates" via the Pockels effect in electrooptic media and has demonstrated subpicosecond temporal resolution and microvolt sensitivity. The technique can be adapted to characterize a wide variety of picosecond electronic devices such as field-effect transistors and photodetectors as well as probe complete integrated circuits with high temporal and spatial resolution.
Keywords :
FETs (field-effect transistors); Integrated circuit measurements; Photodetectors; Pockels effect; Sampling methods; Transient analysis; Ultrafast optics; Circuits; Electric variables measurement; Epitaxial growth; FETs; HEMTs; Josephson junctions; Molecular beam epitaxial growth; Photodetectors; Sampling methods; Spatial resolution;
fLanguage :
English
Journal_Title :
Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9197
Type :
jour
DOI :
10.1109/JQE.1986.1072867
Filename :
1072867
Link To Document :
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