DocumentCode
1107456
Title
Subpicosecond electrooptic sampling: Principles and applications
Author
Valdmanis, Janis A. ; Mourou, G.
Author_Institution
AT&T Bell Lab., Murray Hill, NJ, USA
Volume
22
Issue
1
fYear
1986
fDate
1/1/1986 12:00:00 AM
Firstpage
69
Lastpage
78
Abstract
This paper reviews the principles and applications of electrooptic sampling for the characterization of repetitive ultrafast electrical transients. Electrooptic sampling is an electric field sensitive technique that utilizes ultrashort optical pulses as "sampling gates" via the Pockels effect in electrooptic media and has demonstrated subpicosecond temporal resolution and microvolt sensitivity. The technique can be adapted to characterize a wide variety of picosecond electronic devices such as field-effect transistors and photodetectors as well as probe complete integrated circuits with high temporal and spatial resolution.
Keywords
FETs (field-effect transistors); Integrated circuit measurements; Photodetectors; Pockels effect; Sampling methods; Transient analysis; Ultrafast optics; Circuits; Electric variables measurement; Epitaxial growth; FETs; HEMTs; Josephson junctions; Molecular beam epitaxial growth; Photodetectors; Sampling methods; Spatial resolution;
fLanguage
English
Journal_Title
Quantum Electronics, IEEE Journal of
Publisher
ieee
ISSN
0018-9197
Type
jour
DOI
10.1109/JQE.1986.1072867
Filename
1072867
Link To Document