• DocumentCode
    1107456
  • Title

    Subpicosecond electrooptic sampling: Principles and applications

  • Author

    Valdmanis, Janis A. ; Mourou, G.

  • Author_Institution
    AT&T Bell Lab., Murray Hill, NJ, USA
  • Volume
    22
  • Issue
    1
  • fYear
    1986
  • fDate
    1/1/1986 12:00:00 AM
  • Firstpage
    69
  • Lastpage
    78
  • Abstract
    This paper reviews the principles and applications of electrooptic sampling for the characterization of repetitive ultrafast electrical transients. Electrooptic sampling is an electric field sensitive technique that utilizes ultrashort optical pulses as "sampling gates" via the Pockels effect in electrooptic media and has demonstrated subpicosecond temporal resolution and microvolt sensitivity. The technique can be adapted to characterize a wide variety of picosecond electronic devices such as field-effect transistors and photodetectors as well as probe complete integrated circuits with high temporal and spatial resolution.
  • Keywords
    FETs (field-effect transistors); Integrated circuit measurements; Photodetectors; Pockels effect; Sampling methods; Transient analysis; Ultrafast optics; Circuits; Electric variables measurement; Epitaxial growth; FETs; HEMTs; Josephson junctions; Molecular beam epitaxial growth; Photodetectors; Sampling methods; Spatial resolution;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/JQE.1986.1072867
  • Filename
    1072867