Title :
Improvements to "A new AC measurement technique to accurately determine MOSFET constants"
Author :
Thoma, Morgan J. ; Westgate, Charles R.
Author_Institution :
AT&T Bell Laboratories, Allentown, PA
fDate :
2/1/1986 12:00:00 AM
Abstract :
Modifications and improvements to the measurement technique described in [1] are presented. In particular, the iterative procedure used to obtain an accurate value for device threshold voltage has been eliminated and replaced by direct calculation. The measurement technique has also been applied to a modulation of the substrate potential in order to obtain an estimate of threshold parameters.
Keywords :
Current measurement; Degradation; Extrapolation; Frequency; Intrusion detection; MOSFET circuits; Measurement techniques; Parameter estimation; Taylor series; Voltage;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1986.22485
